Mössbauer spectroscopy study surface structure of Si implanted by57Fe
| Autor: | Q. Wang, Zhang Xiufang, Guo Youjiang, Gao Naifei |
|---|---|
| Rok vydání: | 1988 |
| Předmět: |
Nuclear and High Energy Physics
Materials science Mössbauer effect Infrared Analytical chemistry Infrared spectroscopy Condensed Matter Physics Atomic and Molecular Physics and Optics Amorphous solid Ion implantation Mössbauer spectroscopy Physical and Theoretical Chemistry Spectroscopy Single crystal |
| Zdroj: | Hyperfine Interactions. 42:1021-1024 |
| ISSN: | 1572-9540 0304-3843 |
| Popis: | Mossbauer spectroscopy, RBS and Infrared absorbed spectroscopy (IAS) analysis were carried out for the single crystal Si and amorphous Si both implanted by57Fe. Mossbauer spectra were fitted by separated and continuous spectrum for single crystal Si and amorphous Si, respectively. Some interesting information of the chemical characteristics around the implanted ions were obtained. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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