X-ray investigation of thin films of lead-silicate glasses

Autor:	O. M. Kanunnikova, F. Z. Gil'mutdinov, V. I. Kozhevnikov, M. F. Sorokina
Rok vydání:	1995
Předmět:	X-ray spectroscopy Chemistry X-ray Analytical chemistry Mineralogy Electron spectroscopy Silicate chemistry.chemical_compound Carbon film Mechanics of Materials Materials Chemistry Ceramics and Composites Thin film Spectroscopy Quartz
Zdroj:	Glass and Ceramics. 52:331-332
ISSN:	1573-8515 0361-7610
DOI:	10.1007/bf00679289
Popis:	The methods of x-ray and electron spectroscopy are used to investigate films of quartz and lead-silicate glasses with a thickness of 200–3000 A. The composition of the films differs from that of massive specimens used for spray-coating. The films are depleted of PbO and the depletion is higher the greater the thickness of the film.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::adf5e51a1f55dd872e85ca5267df7c69 https://doi.org/10.1007/bf00679289 Zobrazit plný text záznamu Full text from SpringerLink