Experimental Analysis of the Effect of Shape of Shock Current Pulses on the Thermal State of a Semiconductor Device

Autor:	I. V. Atanov, V. Ya. Khorol’skii, Sh. Zh. Gabrielyan, V. G. Zhdanov
Rok vydání:	2022
Předmět:	Electrical and Electronic Engineering
Zdroj:	Russian Electrical Engineering. 93:431-434
ISSN:	1934-8010 1068-3712
DOI:	10.3103/s1068371222070045
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::adf4565cfbdaad027d31e3af479accd8 https://doi.org/10.3103/s1068371222070045 Zobrazit plný text záznamu Full text from SpringerLink