| Autor: |
Masahiro Fujita, Kailash Ahirwar, Satyadev Ahlawat, Virendra Singh, Jaynarayan Tudu |
| Rok vydání: |
2019 |
| Předmět: |
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| Zdroj: |
IOLTS |
| DOI: |
10.1109/iolts.2019.8854411 |
| Popis: |
Scan design-for-test (DfT) feature can be exploited as a side channel to break a cryptographic chip. The stringent test and diagnosis requirements of present-day complex system-on-chip (SoC) make use of the scan DfT feature unavoidable. However, being a threat to cryptographic chips, it needs to be secured against the scan-based side-channel attacks. In this paper, we propose a simple yet effective technique to prevent scan attack on Advanced Encryption Standard (AES) cryptographic chip. The proposed technique restricts the user from applying any random inputs at the plain-text inputs. To use the scan feature theplain-text inputs must be forced to a constant all-0 or all-1 value throughout the test session. Because of this feature, there is no possibility of mounting any differential scan attack. The proposed technique is simple to implement and does not have any impact on test coverage. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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