A Dynamic Thermal Modeling of Chemical Mechanical Polishing Process

Autor: Jong-Won Seok
Rok vydání: 2004
Předmět:
Zdroj: Transactions of the Korean Society of Mechanical Engineers A. 28:617-623
ISSN: 1226-4873
DOI: 10.3795/ksme-a.2004.28.5.617
Popis: This paper describes a dynamic thermal model for a representative dual axis rotational Chemical-Mechanical Polishing (CMP) tool. The model is one-dimensional but configured in the two-dimensional space and consists of three sub-models (pad, wafer and slurry fluid), with the first and the second that are time-dependent heat conduction-convection models with linear stationary (wafer) and nonlinear moving (pad) boundary conditions, and the last one that is a heat transport-convection model (slurry fluid). The modeling approach is validated by comparing the simulation results with available experimental data.
Databáze: OpenAIRE