Study by transmission electron microscopy and electron diffraction of thin polyethylene films
| Autor: | N Popescu-Pogrion, M Tirnovan |
|---|---|
| Rok vydání: | 1998 |
| Předmět: |
Materials science
business.industry Metals and Alloys Surfaces and Interfaces Electrical treeing Polyethylene Space charge Evaporation (deposition) Surfaces Coatings and Films Electronic Optical and Magnetic Materials chemistry.chemical_compound Optics Electron diffraction chemistry Transmission electron microscopy Materials Chemistry Irradiation Composite material Thin film business |
| Zdroj: | Thin Solid Films. 317:232-234 |
| ISSN: | 0040-6090 |
| DOI: | 10.1016/s0040-6090(97)00521-x |
| Popis: | Polyethylene thin films of different thickness have been obtained by evaporation method. We have produced the treeing discharge by electron beam irradiation. The films have been examined by transmission electron microscopy (TEM) and electron diffraction (ED), before and after irradiation. It is observed that: (1) the polyethylene thin films have a structure of the fine spherulites before irradiation; (2) structural damages (channels, treeing figures and zones in which the material was melted and resolidified) accompanying the space charge produced in thin polyethylene films. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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