Transient-to-digital converter to detect electrical fast transient (EFT) disturbance for system protection design

Autor:	Tung-Yang Chen, Shih-Fan Chen, Cheng-Cheng Yen, Ming-Dou Ker, Ching-Ling Tsai, Wan-Yen Lin
Rok vydání:	2011
Předmět:	Engineering Electrostatic discharge business.industry Electrical engineering Hardware_PERFORMANCEANDRELIABILITY computer.file_format System protection Data conversion CMOS Electronic engineering Silicon chip System on a chip Transient (oscillation) business computer Voltage
Zdroj:	2011 IEEE International Conference on IC Design & Technology.
DOI:	10.1109/icicdt.2011.5783183
Popis:	New on-chip 4-bit transient-to-digital converter for electrical fast transient (EFT) protection design has been proposed. The converter is designed to detect EFT-induced transient disturbances and transfer different EFT voltages into digital codes under EFT tests. The experimental results in silicon chip have confirmed the successful digital output codes.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::ad454f465df8bc62ae83e0aae8cead8a https://doi.org/10.1109/icicdt.2011.5783183 Zobrazit plný text záznamu