Temperature dependence of the dielectric strength of zinc sulfide films
Autor: | L. F. Ikonnikova, V. A. Mukhachev, A. A. Zhigal'skii, P. E. Troyan, T. S. Minakova |
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Rok vydání: | 1996 |
Předmět: | |
Zdroj: | Russian Physics Journal. 39:576-578 |
ISSN: | 1573-9228 1064-8887 |
Popis: | The temperature dependence of the dielectric strength Epn of ZnS:Mn films produced by high-frequency magnetron sputtering was investigated in the range T=20–200°C. It is shown that processes associated with removal of adsorbed water from the ZnS:Mn films are responsible for the maximum on the Epn=f(T) curve. Data on the temperature dependence of the capacitance and loss-angle are given for thin-film systems based on ZnS:Mn. |
Databáze: | OpenAIRE |
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