Temperature dependence of the dielectric strength of zinc sulfide films

Autor:	L. F. Ikonnikova, V. A. Mukhachev, A. A. Zhigal'skii, P. E. Troyan, T. S. Minakova
Rok vydání:	1996
Předmět:	Range (particle radiation) chemistry.chemical_compound Adsorption Materials science Dielectric strength chemistry Analytical chemistry General Physics and Astronomy Dielectric loss Sputter deposition Capacitance Zinc sulfide
Zdroj:	Russian Physics Journal. 39:576-578
ISSN:	1573-9228 1064-8887
Popis:	The temperature dependence of the dielectric strength Epn of ZnS:Mn films produced by high-frequency magnetron sputtering was investigated in the range T=20–200°C. It is shown that processes associated with removal of adsorbed water from the ZnS:Mn films are responsible for the maximum on the Epn=f(T) curve. Data on the temperature dependence of the capacitance and loss-angle are given for thin-film systems based on ZnS:Mn.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::ad382fbeb76659546687a8e97295f529 https://doi.org/10.1007/bf02437024 Zobrazit plný text záznamu Full text from SpringerLink