| Autor: |
G. Blaise, C. Legressus, B. Vallayer, Daniel Treheux |
| Rok vydání: |
2003 |
| Předmět: |
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| Zdroj: |
[Proceedings] 1992 Annual Report: Conference on Electrical Insulation and Dielectric Phenomena. |
| DOI: |
10.1109/ceidp.1992.283251 |
| Popis: |
Insulators are charged under electron bombardment and the variation of potential V is measured as a function of the electron dose D. Three cases are observed: (1) V is proportional to D; (2) V reaches a plateau; and (3) the V(D) curve shows various extrema. These are respectively interpreted as: (1) due to a stable implanted charge in the electron voltage range used to charge the sample; (2) due to the appearance of a steady-state leakage current occuring when a critical space charge is reached; and (3) due to structural modifications of the material. These interpretations are supported by electrostatic calculations combined with electron microscopy experiments. > |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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