Evaluation of Confocal X-ray Analysis for Single-Atom Detection in a Thin Specimen by an Advanced Analytical Electron Microscope

Autor:	Masashi Watanabe, Ray F. Egerton
Rok vydání:	2020
Předmět:	Materials science Confocal Analytical electron microscope Atom (order theory) X ray analysis Instrumentation Molecular physics
Zdroj:	Microscopy and Microanalysis. 26:1512-1514
ISSN:	1435-8115 1431-9276
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::acd95875ce9187218fc13c075285d947 https://doi.org/10.1017/s143192762001836x Zobrazit plný text záznamu