Novel materials for the semiconductor industry, deposited using a rapid thermal chemical vapour deposition system

Autor: F.H. Ruddell, B.M. Armstrong, J.H. Montgomery, David McNeill, Harold Gamble
Rok vydání: 1992
Předmět:
Zdroj: Journal of Materials Processing Technology. 33:481-492
ISSN: 0924-0136
DOI: 10.1016/0924-0136(92)90281-v
Popis: This paper describes a custom-built rapid thermal chemical vapour deposition system developed to allow the growth of silicon and silicon carbide at low pressure and with minimal thermal budget. The reactor uses tungsten-halogen lamps to heat the single process wafer to a maximum temperature of 1080°C with a maximum rate of 250°C/s. A microwave magnetron provides gas plasma chemistry capability. Silicon layers with low oxygen contamination are produced at around 720°C and 0.07 mbar using silane. Silicon carbide is deposited at around 970°C and 10 mbar using silane/propane chemistry. Both processes incorporate a CF4 plasma clean of the wafer surface prior to deposition. Bipolar transistors produced with a silicon carbide emitter gave higher gains than standard reference devices.
Databáze: OpenAIRE