Nitrogen Plasma Doping of Single-Crystal ZnTe and CdZnTe on Si by MBE
| Autor: | Thomas Seldrum, Ramesh Dhere, Eric Colegrove, Xiaojin Wang, Xin Zheng, J. H. Park, S. Sivananthan, Richard Kodama |
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| Rok vydání: | 2013 |
| Předmět: |
Argon
Materials science Solid-state physics business.industry Doping Analytical chemistry chemistry.chemical_element Plasma Condensed Matter Physics Nitrogen Electronic Optical and Magnetic Materials chemistry Materials Chemistry Optoelectronics Electrical and Electronic Engineering business Saturation (magnetic) Single crystal Molecular beam epitaxy |
| Zdroj: | Journal of Electronic Materials. 42:3239-3242 |
| ISSN: | 1543-186X 0361-5235 |
| Popis: | We have investigated in situp-type doping of ZnTe and CdZnTe on Si(211) by molecular beam epitaxy using a radiofrequency (RF)-nitrogen plasma source for application to multijunction II–VI-based solar cells. CdZnTe would be used as a wide-gap top cell in a monolithic multijunction device, and ZnTe or CdZnTe could be used for the p-side of tunnel junctions. Highly p-type material is required for producing the high-quality tunnel junctions crucial for maintaining current flow, and p-doping of order 1017 cm−3 is required for the generation of a large built-in potential in the absorber region of solar cells. Our uniformly doped films exhibited good Hall characteristics, especially considering the large lattice mismatch between Si and either ZnTe or CdZnTe. Crystal quality was examined by x-ray diffraction. Nitrogen incorporation was examined as a function of the source-gas dilution with argon. A sample with layers of CdZnTe doped using 1% to 100% nitrogen was grown on nominally undoped CdZnTe and analyzed using secondary-ion mass spectrometry. The nitrogen incorporation differed by only a factor of 10, despite the factor of 100 difference in the nitrogen concentration in the plasma, indicating a saturation effect. |
| Databáze: | OpenAIRE |
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