Synthesis and EXAFS characterization of amorphous FePS3 thin films

Autor:	R. Cortes, René Clément, J. P. Audière, C. Gledel
Rok vydání:	1988
Předmět:	chemistry.chemical_classification Materials science Extended X-ray absorption fine structure Semiconductor materials Analytical chemistry Amorphous solid Characterization (materials science) Crystallography chemistry General Materials Science Thin film Debye–Waller factor Inorganic compound Stoichiometry
Zdroj:	Journal of Materials Science Letters. 7:1054-1055
ISSN:	1573-4811 0261-8028
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::ac886bd2c514e978e786e38f8c2dcd3c https://doi.org/10.1007/bf00720824 Zobrazit plný text záznamu Full text from SpringerLink