DC and Transient Microscopic Simulation of Nanowire NMOSFETs

Autor:	Christoph Jungemann, Tobias Rippchen, Maziar Noei, Tobias Linn
Rok vydání:	2023
Zdroj:	2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
DOI:	10.1109/edtm55494.2023.10102931
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::abfa5a8da03cdfd78297a44e7c05721e https://doi.org/10.1109/edtm55494.2023.10102931 Zobrazit plný text záznamu