Self-aligned silicide process technology for sub-0.25-μm geometries
| Autor: | Rajan Nagabushnam, Scott C. Bolton, Paul G. Y. Tsui, Ted R. White, H. Chuang, Dave Kolar, Larry Pulvirent, Larry E. Frisa, Mohamed Jahanbani, Jeff Cope |
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| Rok vydání: | 1998 |
| Předmět: |
inorganic chemicals
Materials science Silicon business.industry technology industry and agriculture Electrical engineering chemistry.chemical_element Tungsten equipment and supplies Salicide Micrometre chemistry.chemical_compound chemistry Silicide Optoelectronics business Cobalt Sheet resistance Titanium |
| Zdroj: | SPIE Proceedings. |
| ISSN: | 0277-786X |
| Popis: | This work compares the extendibility of titanium with pre- deposition amorphizing implant (PAI) and cobalt salicides to sub-0.25 micrometer technologies. Cobalt salicide has low sheet resistance and a tighter distribution of sheet resistances than titanium salicide with PAI for narrow linewidths. The reaction of cobalt with silicon is not affected by dopants in the silicon as the reaction of titanium is. Less cobalt need be deposited than titanium for a given sheet resistance target. Cobalt salicide requires fewer process steps than titanium salicide with PAI. Cobalt salicide has lower diodes for shallow junctions, requires a smaller thermal budget, and provides a lower contact resistances than titanium salicide. Thus, cobalt salicide process technology has better process control, is more compatible with sub-0.25 micrometer devices, and more compatible with interlayer connections than titanium salicide with PAI. |
| Databáze: | OpenAIRE |
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