Study of Total Ionizing Dose and Single Event Upset effects on a commercial 65nm-SRAM using gamma and neutron radiation
| Autor: | Pedro Martín-Holgado, Mario Sacristán Barbero, Yolanda Morilla, Rubén García Alia |
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| Rok vydání: | 2022 |
| Zdroj: | Book of Abstracts. |
| Databáze: | OpenAIRE |
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