Leakage Current Pathways and Magnitudes in Correlation to PID of CIGS Thin Film Modules
| Autor: | Manz, P., Wesselak, V., Voswinckel, S., Trautmann, B., Fokuhl, E., Schmidt, C. |
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| Jazyk: | angličtina |
| Rok vydání: | 2014 |
| Předmět: | |
| DOI: | 10.4229/eupvsec20142014-5bv.4.35 |
| Popis: | 29th European Photovoltaic Solar Energy Conference and Exhibition; 3194-3199 Potential-induced degradation (PID) can occur when PV modules are mounted in a string with a high system potential (up to ±1000V). It is well known that leakage currents which flow between the module connectors and ground can indicate the progress of power degradation of the module. This can be helpful to evaluate the effectiveness and significance of accelerated aging tests e.g. Bias Damp Heat tests in a climatic chamber. However, not all leakage currents contribute to a power loss. In this study the leakage current pathways and their magnitudes of CIGS thin film modules will be identified depending on the climatic conditions and their effect on degradation is evaluated. Furthermore, different foils are used in the modules, so the influence of the conductivity and the effect on the power loss is investigated. This is necessary to be able to predict the power loss of PV modules in dependence of outdoor conditions by measuring leakage currents. |
| Databáze: | OpenAIRE |
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