Failure Analysis of FeCAPs. Electrical Behaviour Under Synchrotron X-Ray Irradiation
| Autor: | V. Ya. Shur, Dirk Wouters, Ivan Baturin, N. Menou, A. M. Castagnos, Ch. Muller, J. A. Johnson |
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| Rok vydání: | 2004 |
| Předmět: |
Materials science
Trapping Condensed Matter Physics Kinetic energy Ferroelectricity Synchrotron Electronic Optical and Magnetic Materials law.invention Capacitor Control and Systems Engineering law Materials Chemistry Ceramics and Composites Degradation (geology) Irradiation X ray irradiation Electrical and Electronic Engineering Composite material |
| Zdroj: | Integrated Ferroelectrics. 61:89-95 |
| ISSN: | 1607-8489 1058-4587 |
| DOI: | 10.1080/10584580490458784 |
| Popis: | This paper presents a preliminary study of the degradation and restoration of ferroelectric properties under X-ray irradiation of Pt/SBT/Pt ferroelectric capacitors (FeCAP) and the degradation in Pt/PZT/Pt FeCAPs. The results seem to point out that aging of irradiated capacitors originates from the pinning of domain walls due to trapping of photo-generated carriers at domain boundaries. For SBT FeCAPs, the recovery of a significant switchable polarisation after electrical cycling under X-ray irradiation indicates that the domain walls are probably weakly pinned. In PZT FeCAPs, the fatigue behaviour during X-ray exposure can be explained as a result of X-ray induced acceleration of the bulk screening process due to increasing of the concentration of bulk carriers, which leads to both static and kinetic imprint effects. |
| Databáze: | OpenAIRE |
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