Characterization of Dynamic and Nanoscale Materials and Metamaterials with Continuously Referenced Interferometry

Autor:	Adam Ollanik, Matthew D. Escarra, George Z. Hartfield, Yaping Ji, Kazi Islam, John Robertson
Rok vydání:	2019
Předmět:	Interferometry Materials science Astronomical interferometer Metamaterial Nanotechnology Nanoscopic scale Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Characterization (materials science)
Zdroj:	Advanced Optical Materials. 7:1901128
ISSN:	2195-1071
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::aa8746a090a7140470b6a8a7490c1b9e https://doi.org/10.1002/adom.201901128 Zobrazit plný text záznamu Plný text