Materials on the International Space Station Experiment (MISSE): Optical Analysis of Molecular Contamination on PEC1 Tray 2

Autor:	P D Fuqua, J D Barrie, C. J. Panetta
Rok vydání:	2007
Předmět:	Materials science Silicon business.industry chemistry.chemical_element Steradian Tray Optics chemistry Ellipsometry International Space Station Wafer Bidirectional reflectance distribution function business Reflectometry
DOI:	10.21236/ada468592
Popis:	Silicon wafers were mounted on the exterior of the International Space Station as a part of MISSE. Post-flight ellipsometry and reflectometry were employed to show that the silicon wafers gained about a 420-A-thick layer of a silica-like contaminant with BRDF scatter values around 1 x l0% per steradian.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::aa6a4294a0686cbc64c5617af963ef43 https://doi.org/10.21236/ada468592 Zobrazit plný text záznamu