| Autor: |
V. Sirisha, J. L. V. Ramana Kumari, M. Asha Rani, N. Balaji |
| Rok vydání: |
2015 |
| Předmět: |
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| Zdroj: |
Lecture Notes in Electrical Engineering ISBN: 9788132227267 |
| DOI: |
10.1007/978-81-322-2728-1_67 |
| Popis: |
Test pattern generation Built-In Self Test (BIST) system is used to carryout testing operation of a circuit. We apply input vectors to the circuit based on logic implementation. A sequence of vectors are applied to the dadda multiplier circuit as inputs, and outputs can be observed in the examined window. The testing analysis of the Device under test (DUT) or Circuit Under Test (CUT) is monitored. The fault conditions and fault free conditions can be observed in the normal mode and test mode. The design and clocking analysis of BIST system is analyzed. In this system, Dadda multiplier circuit can be used as Device under test (DUT). The vector monitoring system is verified by Modelsim simulator, synthesized using Xilinx ISE tool and implemented in Spartan3 FPGA. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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