On the interpretation of voltage versus current data for high- temperature superconductors in terms of distribution of intergrain critical current densities
| Autor: | Osvaldo F. Schilling, Matsuda Shinpei, Katsuzo Aihara |
|---|---|
| Rok vydání: | 1992 |
| Předmět: |
Superconductivity
Physics Condensed matter physics Equivalent series resistance Monte Carlo method Energy Engineering and Power Technology Condensed Matter Physics Electronic Optical and Magnetic Materials law.invention law Electrical resistivity and conductivity Equivalent circuit Electrical and Electronic Engineering Resistor Voltage Electronic circuit |
| Zdroj: | Physica C: Superconductivity. 201:397-402 |
| ISSN: | 0921-4534 |
| DOI: | 10.1016/0921-4534(92)90489-y |
| Popis: | We report on a method for predicting the DC voltage versus current characteristics of thin polycrystalline high-temperature superconductor samples from critical density ( J c ) distributions determined from AC susceptibility measurements. A sample may be modeled as a two-dimensional electric circuit with the grain-boundaries (the resistors) assuming a wide range of critical current densities, which are assumed proportional to the boundaries' conductances ( C ). The equivalent resistance ( R eq ) of a square- lattice network of boundaries may thus be exactly calculated for any number of boundaries by iteratively applying the “delta-Y” transformation to the cells of the network. The J c s for the boundaries may be generated by Monte Carlo techniques following a given statistical distribution, yielding R eq and thus V = IR eq . Changes of microstructure may be simulated by imposing that certain resistors have infinite conductance. |
| Databáze: | OpenAIRE |
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