Test Results of Proton Single-Event Effects Conducted by the Jet Propulsion Laboratory

Autor:	Sergeh Vartanian, Gregory R. Allen, Farokh Irom
Rok vydání:	2019
Předmět:	Engineering Spacecraft business.industry Analogue switch Hardware_PERFORMANCEANDRELIABILITY Propulsion Jet propulsion Proton (rocket family) CMOS MOSFET Hardware_INTEGRATEDCIRCUITS Electronic engineering Microelectronics business
Zdroj:	2019 IEEE Radiation Effects Data Workshop.
DOI:	10.1109/redw.2019.8906643
Popis:	This paper reports recent single-event effects results for a variety of microelectronic devices that include ADC, DAC, DDS, MOSFET driver, analog switch, oscillator, and zero delay buffer. The data was collected to evaluate these devices for possible use in NASA spacecraft. Six of ten devices under study were sensitive to SEL, and the latchup was destructive.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::aa01ead582a2ff4a2f7e7c06f560fd6c https://doi.org/10.1109/redw.2019.8906643 Zobrazit plný text záznamu