| Autor: |
Tae Chan Kim, Yong Jei Lee, Hae Kyung Kong, Han Soo Lee, Jung Chak Ahn, Moo Sup Lim, Seoung Hyun Kim, Dong-ki Min, Kwang Hyuk Bae, Min Seok Oh, Goto Hiroshige, Soo Bang Kim, Sung Kwan Kim, Kyung-Il Kim |
| Rok vydání: |
2012 |
| Předmět: |
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| Zdroj: |
NEWCAS |
| DOI: |
10.1109/newcas.2012.6329022 |
| Popis: |
This paper presents a BSI(backside-illumination) 14µm-pixel QVGA CMOS image sensor SOC(System On a Chip) measuring TOF(Time-Of-Flight) by 20MHz-intensity modulation of 850nm-wavelength light. The 34% of overall QE(Quantum Efficiency) at 850nm-wavelength is acquired by BSI structure and optimized micro-lens. The DE(Depth Error) less than 1.5% within 6m is achieved with imaging lens of f/1.2 and LED array of which the optical intensity is 0.6W/m2 at 1m-distance. Additionally, the depth linearity is measured as that the coefficient of determination is equal to 0.9999. In order to operate under background light illumination on a scene, dual CG(Conversion Gain) scheme is implemented in each pixel. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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