Optical properties of ZnSe and Zn0.87Mn0.13Se epilayers determined by spectroscopic ellipsometry

Autor:	Michael Hetterich, B. Daniel, M. Schubert, J. Kvietkova, Daniel Spemann
Rok vydání:	2004
Předmět:	Range (particle radiation) Chemistry Metals and Alloys Analytical chemistry Surfaces and Interfaces Dielectric Photon energy Epitaxy Surfaces Coatings and Films Electronic Optical and Magnetic Materials Ellipsometry Materials Chemistry Spin (physics) Ternary operation Molecular beam epitaxy
Zdroj:	Thin Solid Films. :228-230
ISSN:	0040-6090
Popis:	The semimagnetic ternary semiconductor material ZnMnSe is a suitable candidate for the use in optoelectronic devices either as a spin aligner or a waveguiding layer. In our work we are studying the optical properties of Zn 1− x Mn x Se layers grown on GaAs (001) substrates by molecular beam epitaxy. We present the complex dielectric function obtained by variable-angle spectroscopic ellipsometry in the photon energy range from 0.75 to 4.5 eV. Between 0.75 and 3.3 eV the experimental data are fitted with a critical-point parametric model. The energies of E 0 , E 0 +Δ 0 , E 1 and E 1 +Δ 1 critical points are given for ZnSe and Zn 0.87 Mn 0.13 Se.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a993cb962ea16785c2079b81941d5c47 https://doi.org/10.1016/j.tsf.2003.11.201 Zobrazit plný text záznamu Full Text from ScienceDirect