An anomaly in the temperature dependence of the resistivity of amorphous metallic FexGe1-xalloys at low temperatures

Autor: A Albers, D S McLachlan
Rok vydání: 1995
Předmět:
Zdroj: Journal of Physics: Condensed Matter. 7:4649-4664
ISSN: 1361-648X
0953-8984
DOI: 10.1088/0953-8984/7/24/006
Popis: The anomalous decrease in the resistivity observed in the amorphous CrxSi1-x, CrxGe1-x, and FexGe1-x systems as T decreases below about 30 K, and the subsequent increase in the resistivity as the temperature decreases below about 4 K are investigated in amorphous FexGe1-x films of nominal thickness 500 AA and 2000 AA for 0.189
Databáze: OpenAIRE