An interference method for studying a substance in the vicinity of its critical point

Autor:	V. G. Domelunksen, M. A. Tsygankov, I. R. Krylov, G. A. Polyanskaya
Rok vydání:	2004
Předmět:	Physics Condensed matter physics chemistry.chemical_element Interference (wave propagation) Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Surface tension Reduced properties Xenon chemistry Critical point (thermodynamics) Wetting Critical exponent Refractive index
Zdroj:	Optics and Spectroscopy. 97:136-140
ISSN:	1562-6911 0030-400X
DOI:	10.1134/1.1781294
Popis:	An interference method for measuring certain parameters of a substance in the vicinity of the critical state is proposed. The essence of the method is to decipher the interference pattern arising upon grazing incidence of a laser beam on a curved liquid-vapor interface. The deciphering allows one to determine the difference between the refractive indices of the two phases and the scaling factor of the wetting meniscus shape. This, in turn, makes it possible to calculate the critical exponents for the temperature dependences of the surface tension and the difference in the densities of the two phases. The ratio of these critical exponents for xenon, measured in the paper, is 3.81±0.03.
Databáze:	OpenAIRE
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