A novel artifact for testing large coordinate measuring machines

Autor:	Steven D. Phillips, D E. Beutel, Daniel S. Sawyer, David E. Ward, Bruce R. Borchardt
Rok vydání:	2001
Předmět:	Engineering drawing Engineering Artifact (error) business.industry General Engineering Uncertain systems Gauge (firearms) Coordinate-measuring machine Retroreflector Interferometry Astronomical interferometer Computer vision Artificial intelligence business
Zdroj:	Precision Engineering. 25:29-34
ISSN:	0141-6359
DOI:	10.1016/s0141-6359(00)00052-0
Popis:	We present a high-accuracy artifact useful for the evaluation of large CMMs. This artifact can be physically probed by the CMM in contrast to conventional techniques that use such purely optical methods as laser interferometers. The system can be used over large distances; for example, over 4 meters, with an uncertainty of less than one part per million. The artifact is relatively inexpensive, robust for use in reasonable industrial environments, and significantly reduces testing time over traditional step gauge measurements.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a93d19c1e63360b3edb132ee572dc957 https://doi.org/10.1016/s0141-6359(00)00052-0 Zobrazit plný text záznamu Full Text from ScienceDirect