Autor: |
Anna Klukowska, Ch. Ebm, Rainer Schöftner, Hans Leichtfried, Michael Mühlberger, E. Platzgummer, Iris Bergmair, Gabi Grützner, H. Loeschner, Anett Kolander |
Rok vydání: |
2009 |
Předmět: |
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Zdroj: |
Microelectronic Engineering. 86:691-693 |
ISSN: |
0167-9317 |
DOI: |
10.1016/j.mee.2008.11.020 |
Popis: |
The use of working stamps for nanoimprint lithography is highly interesting for a number of reasons like an increased lifetime and often a better manufacturability of the master stamp. We present results on the use of Ormostamp as a material for working stamps in UV-NIL. Imprinting properties and anti-sticking treatments have been investigated. So far a minimum feature size of 50nm can be achieved. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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