A PC-based automated guided probe testing system

Autor:	K.G. Goad, Joseph G. Tront, J.C. McKeeman
Rok vydání:	2003
Předmět:	Engineering Automatic test equipment Printed circuit board Physical structure business.industry In-circuit test Process (computing) Flying probe Automatic test pattern generation business Computer hardware
Zdroj:	[1989] Proceedings. The Twenty-First Southeastern Symposium on System Theory.
DOI:	10.1109/ssst.1989.72489
Popis:	The physical structure of the PC-based guided probe testing system is presented. Major components of the system are shown, and a discussion of their functioning within the system is given. The guided probe algorithm that is used to locate an error is an analytic process. A typical automatic test pattern generation system will start by simulating a number of random test patterns in order to obtain expected responses and cover a percentage of possible faults. Testing strategies that provide insight into the efficient testing of printed circuit boards are discussed. >
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a8c2fbc682b7d2f1b0882d8ec55bd781 https://doi.org/10.1109/ssst.1989.72489 Zobrazit plný text záznamu