Effects of thermal annealing conditions on the electrical characteristics of TES-ADT thin-film transistors
| Autor: | Joel Ndikumana, Jaehoon Park, Hyeon-Seok Jeong, Jin-Hyuk Bae, Eui-Jik Kim |
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| Rok vydání: | 2019 |
| Předmět: |
Materials science
Annealing (metallurgy) business.industry Transistor 02 engineering and technology General Chemistry 010402 general chemistry 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences 0104 chemical sciences law.invention law Thin-film transistor Exposure period Optoelectronics General Materials Science 0210 nano-technology business Solution process |
| Zdroj: | Molecular Crystals and Liquid Crystals. 679:58-64 |
| ISSN: | 1563-5287 1542-1406 |
| DOI: | 10.1080/15421406.2019.1597546 |
| Popis: | We investigated the annealing temperature and exposure period dependence of electrical characteristics of bottom-gate/top-contact solution-processed organic thin-film transistors (TFTs) fabricated ... |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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