Autor: |
K. S. Zemtsov, Vasily S. Anashin, R. G. Useinov, Maxim S. Gorbunov, A.E. Kozyukov, Alexander I. Ozerov, Gennady I. Zebrev, Vladimir V. Emeliyanov |
Rok vydání: |
2015 |
Předmět: |
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Zdroj: |
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 775:41-45 |
ISSN: |
0168-9002 |
Popis: |
Mean and partial cross-section concepts and their connections to multiplicity and statistics of multiple cell upsets (MCUs) in highly-scaled digital memories are introduced and discussed. The important role of the experimental determination of the upset statistics is emphasized. It was found that MCU may lead to quasi-linear dependence of cross-sections on linear energy transfer (LET). A new form of function for interpolation of mean cross-section dependences on LET has been proposed. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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