Vidya: Performing Code-Block I/O Characterization for Data Access Optimization
| Autor: | Xian-He Sun, Anthony Kougkas, Prajwal Challa, Hariharan Devarajan |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
Input/output
Profiling (computer programming) 020203 distributed computing Data access Computer engineering business.industry Computer science Computer data storage 0202 electrical engineering electronic engineering information engineering 020201 artificial intelligence & image processing 02 engineering and technology business |
| Zdroj: | HiPC |
| Popis: | Understanding, characterizing and tuning scientific applications' I/O behavior is an increasingly complicated process in HPC systems. Existing tools use either offline profiling or online analysis to get insights into the applications' I/O patterns. However, there is lack of a clear formula to characterize applications' I/O. Moreover, these tools are application specific and do not account for multi-tenant systems. This paper presents Vidya, an I/O profiling framework which can predict application's I/O intensity using a new formula called Code-Block I/O Characterization (CIOC). Using CIOC, developers and system architects can tune an application's I/O behavior and better match the underlying storage system to maximize performance. Evaluation results show that Vidya can predict an application's I/O intensity with a variance of 0.05%. Vidya can profile applications with a high accuracy of 98% while reducing profiling time by 9x. We further show how Vidya can optimize an application's I/O time by 3.7x. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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