C60 films as etching masks for creation of micrometer and submicrometer YBa2Cu3O7 structures

Autor: Marianna Španková, J. Vincenc Oboňa, Stefan Chromik, Zs. Őszi, Ivan Kostic
Rok vydání: 2006
Předmět:
Zdroj: Physica C: Superconductivity and its Applications. 435:37-40
ISSN: 0921-4534
DOI: 10.1016/j.physc.2006.01.014
Popis: We have developed a new technique for etching of high-temperature superconducting YBa 2 Cu 3 O 7 (YBCO) thin films using C 60 etching mask. The minimal pattern size 0.5 μm was reached in the process of the ion beam etching. Wet chemical etching in Br–ethanol using C 60 mask was successfully realized. In the case of the chemical etching as a mask we have a 400 nm thick patterned C 60 layer due its insolubility in Br–ethanol. The submicron patterning of the YBCO films, thick up to 600 nm, was realized using Ar ion beam etching through the patterned C 60 film. In this case, the C 60 mask, 600–800 nm thick, was created by lift off technique in PMMA electron resist.
Databáze: OpenAIRE