Study of a non-intercepting ion beam diagnostic for beam density profile

Autor:	Enrique Henestroza, W.L. Waldron, F.M. Bieniosek, D.L. Vanecek, Prabir K. Roy, D. Shuman, Wayne G. Greenway, Shmuel Eylon, Ryan Hannink, Simon S. Yu, Jozsef Ludvig
Rok vydání:	2005
Předmět:	Physics Nuclear and High Energy Physics Ion beam business.industry Focused ion beam Beam parameter product Ion beam deposition Optics Deflection (physics) Cathode ray Physics::Accelerator Physics Laser beam quality Atomic physics business Instrumentation Electron gun
Zdroj:	Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 544:520-526
ISSN:	0168-9002
DOI:	10.1016/j.nima.2005.01.285
Popis:	An electron beam diagnostic system for measuring the charge distribution of an ion beam without changing its properties is investigated. The conceptual basis of the diagnostic, the design and setup of the system, characterization of the mechanical construction, electron beam transport and its deflection with an ion beam is presented.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a711c2f8c8d8db69bc79d70df0aac881 https://doi.org/10.1016/j.nima.2005.01.285 Zobrazit plný text záznamu Full Text from ScienceDirect