Characterization of CdZnTe after argon ion beam bombardment

Autor:	José Luis Plaza, Omar S. Martinez, H. Bensalah, Q. Zheng, V. Hortelano, Ernesto Diéguez, V. Carcelén, J. Crocco
Rok vydání:	2012
Předmět:	Materials science Photoluminescence Argon Ion beam Scanning electron microscope Mechanical Engineering Metals and Alloys Analytical chemistry chemistry.chemical_element Cathodoluminescence Ion chemistry Mechanics of Materials Materials Chemistry Irradiation Luminescence
Zdroj:	Journal of Alloys and Compounds. 543:233-238
ISSN:	0925-8388
DOI:	10.1016/j.jallcom.2012.07.109
Popis:	The objective of this work is to analyze the effects of argon ion irradiation process on the structure and distribution of Te inclusions in Cd 1-x Zn x Te crystals. The samples were treated with different ion fluences ranging from 2 to 8 × 10 17 cm −2 . The state of the samples before and after irradiation were studied by Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM), Cathodoluminescence, Photoluminescence, and micro-Raman spectroscopy. The effect of the irradiation on the surface of the samples was clearly observed by SEM or AFM. Even for small fluences a removal of polishing scratches on the sample surfaces was observed. Likely correlated to this effect, an important enhancement in the luminescence intensity of the irradiated samples was observed. An aggregation effect of the Te inclusions seems to occur due to the Ar bombardment, which are also eliminated from the surfaces for the highest ion fluences used.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a701d850aeb6cbc510e6447515b48e1e https://doi.org/10.1016/j.jallcom.2012.07.109 Zobrazit plný text záznamu Full Text from ScienceDirect