Crystalline effects in Auger electron spectroscopy
Autor: | A. Lemoel, H. E. Bishop, B. Chornik, C. Legressus |
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Rok vydání: | 1984 |
Předmět: |
Auger electron spectroscopy
Reflection high-energy electron diffraction Auger effect Low-energy electron diffraction Chemistry Energy-dispersive X-ray spectroscopy Surfaces and Interfaces General Chemistry Condensed Matter Physics Channelling Surfaces Coatings and Films Auger Condensed Matter::Materials Science symbols.namesake Electron diffraction Materials Chemistry symbols Physics::Accelerator Physics Atomic physics |
Zdroj: | Surface and Interface Analysis. 6:116-128 |
ISSN: | 1096-9918 0142-2421 |
DOI: | 10.1002/sia.740060304 |
Popis: | The intensity of Auger emission is modified by the crystalline nature of the sample. One contribution to this effect is from the anistropic emission of the Auger electrons themselves but a second important contribution comes from changes in the surface ionization as a result of diffraction of the incident electron beam, (electron channelling). In practice the effects of anisotropic emission are often largely averaged out over the input aperture of the electron analyser but the contribution from electron channelling is not averaged and can be large. For instance there can be up to a three-fold variation in the intensity of the KLL peak of aluminium when the incident beam is rotated ±5° about the [110] direction. Experimental measurements showing the magnitude of crystallographic effects in an Auger spectrometer (ESCALAB II, V.G.Scientific Ltd) are presented for polycrystalline copper and silver samples and for single crystals of aluminium and magnesium oxide. The channelling contrast can be explained qualitatively in terms of the two beam theory of electron diffraction but a multiple beam treatment is necessary to give a quantitative description of the effect. |
Databáze: | OpenAIRE |
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