Correlation of 2D-interface defect density and electrical parameters of a GZO/p-Si heterojunctions: application to three surface morphologies

Autor:	C. Ben Alaya, B. Dridi Rezgui, F. Chaabouni, B. Khalfallah, S. Aouida, M. Bouaïcha
Rok vydání:	2023
Předmět:	Electrical and Electronic Engineering Condensed Matter Physics Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials
Zdroj:	Journal of Materials Science: Materials in Electronics. 34
ISSN:	1573-482X 0957-4522
DOI:	10.1007/s10854-022-09537-3
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a6ed9341261bbcd29de815b9b20c9600 https://doi.org/10.1007/s10854-022-09537-3 Zobrazit plný text záznamu Full text from SpringerLink