X-Ray Diffraction Properties of Silica Thin Films Having Single Crystalline Mesoporous Structures

Autor:	Takashi Noma, Atsuo Iida, Hirokatsu Miyata, Kazuhiro Takada
Rok vydání:	2007
Předmět:	Condensed Matter::Soft Condensed Matter Diffraction Crystallography Materials science Liquid crystal Astrophysics::High Energy Astrophysical Phenomena X-ray crystallography Physics::Optics X-ray optics Synchrotron radiation Thin film Mesoporous material Structural regularity
Zdroj:	Optical Interference Coatings.
Popis:	Detailed X-ray diffraction study of silica films with single crystalline mesoporous structures shows that the behavior of X-rays in these mesoporous materials with nano-scaled structural regularity is quite identical to that in real crystals.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a69617a30b56c64ce06763ad78c03a41 https://doi.org/10.1364/oic.2007.fa10 Zobrazit plný text záznamu