X-Ray Diffraction Properties of Silica Thin Films Having Single Crystalline Mesoporous Structures
Autor: | Takashi Noma, Atsuo Iida, Hirokatsu Miyata, Kazuhiro Takada |
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Rok vydání: | 2007 |
Předmět: | |
Zdroj: | Optical Interference Coatings. |
Popis: | Detailed X-ray diffraction study of silica films with single crystalline mesoporous structures shows that the behavior of X-rays in these mesoporous materials with nano-scaled structural regularity is quite identical to that in real crystals. |
Databáze: | OpenAIRE |
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