New CsI/a-Si 17' x 17' x-ray flat-panel detector provides superior detectivity and immediate direct digital output for general radiography systems

Autor: Jean Chabbal, Vincent Spinnler, Robert Neyret, Gerard Vieux, Christophe Chaussat, Thierry Ducourant
Rok vydání: 1998
Předmět:
Zdroj: SPIE Proceedings.
ISSN: 0277-786X
DOI: 10.1117/12.317049
Popis: A new 17' X 17' immediate direct digital flat panel detector has been developed to fit the needs of General Radiography. After reviewing a few key aspects of the General Radiography needs (X-ray energy range and associated measurement conditions, system integration and system operation), we describe the new detector Cesium Iodide/Amorphous Silicon based technology, and give measurement results (MTF, DQE stability). We compare the new detector performance to existing technologies (film/screen combination, storage phosphor devices) and also to other flat panel solutions (Selenium). We conclude that the CsI/a-Si technology is now the best suited one in order to fit the needs of General Radiography, this means all kinds of examinations (chest, abdomen, bones, extremities. . .) which have been up to now done using films.
Databáze: OpenAIRE