Delay defect characteristics and testing strategies
| Autor: | Kee Sup Kim, Subhasish Mitra, P.G. Ryan |
|---|---|
| Rok vydání: | 2003 |
| Předmět: |
Engineering
Generation time business.industry Design for testing Process (computing) Hardware_PERFORMANCEANDRELIABILITY Pattern generation Reliability engineering Test (assessment) Design styles Hardware and Architecture Probability distribution Process control Electrical and Electronic Engineering business Software |
| Zdroj: | IEEE Design & Test of Computers. 20:8-16 |
| ISSN: | 0740-7475 |
| Popis: | Several factors influence production delay testing and corresponding DFT techniques: defect sources, design styles. ability to monitor process characteristics, test generation time. available test time, and tester memory. We present an overview of delay defect characteristics and the impact of delay defects on IC quality. We also discuss practical delay-testing strategy in terms of test pattern generation, test application speed, DFT, and test cost. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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