Structural Properties of Thin Films Obtained by Magnetron Sputtering of Polydiacetylene
| Autor: | O. A. Streletskii, O. Yu. Nishchak, I. A. Zavidovskii, N. F. Savchenko, Alexander N. Shchegolikhin |
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| Rok vydání: | 2020 |
| Předmět: |
010302 applied physics
Materials science Solid-state physics Analytical chemistry Sputter deposition Condensed Matter Physics 01 natural sciences Electronic Optical and Magnetic Materials Monocrystalline silicon symbols.namesake X-ray photoelectron spectroscopy Sputtering Transmission electron microscopy 0103 physical sciences symbols Thin film 010306 general physics Raman spectroscopy |
| Zdroj: | Physics of the Solid State. 62:2184-2190 |
| ISSN: | 1090-6460 1063-7834 |
| DOI: | 10.1134/s1063783420110360 |
| Popis: | Films obtained by radio-frequency sputtering of monocrystalline polydiacetylene (PDA) are under study. The structure is studied by Raman spectroscopy, transmission electron microscopy, and X-ray photoelectron spectroscopy. It is shown that the obtained films have a heterogeneous structure containing agglomerates of nanosized inclusions of the initial PDA and irregular sp/sp2 hybridized carbon chain fragments. |
| Databáze: | OpenAIRE |
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