Voltage-Aware Chip-Level Design for Reliability-Driven Pin-Constrained EWOD Chips

Autor:	Shang-Tsung Yu, Sheng-Han Yeh, Tsung-Wei Huang, Tsung-Yi Ho, Jia-Wen Chang
Rok vydání:	2014
Předmět:	Engineering Reliability (semiconductor) business.industry Electrical engineering Electrical and Electronic Engineering Routing (electronic design automation) business Chip Computer Graphics and Computer-Aided Design Software Voltage
Zdroj:	IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 33:1302-1315
ISSN:	1937-4151 0278-0070
DOI:	10.1109/tcad.2014.2331340
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a54c9d3cdb38c78d7c15a15b15d28bd7 https://doi.org/10.1109/tcad.2014.2331340 Zobrazit plný text záznamu