Book Review: 'Failure Mechanisms in Semiconductor Devices', E. Ajith Amerasekera and Farid N. Najm

Autor:	Chuks N Oguibe
Rok vydání:	1998
Předmět:	Engineering business.industry Semiconductor device Electrical and Electronic Engineering business Engineering physics Industrial and Manufacturing Engineering
Zdroj:	Journal of Electronics Manufacturing. :73-74
ISSN:	0960-3131
DOI:	10.1142/s0960313198000069
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a548107f69b7f66c5a11967dc8fa7b23 https://doi.org/10.1142/s0960313198000069 Zobrazit plný text záznamu