Adaptive semi-empirical model for non-contact atomic force microscopy

Autor: Xi Chen, Jun-Kai Tong, Zhi-Xin Hu
Rok vydání: 2022
Předmět:
Zdroj: Chinese Physics B. 31:088202
ISSN: 1674-1056
Popis: Non-contact atomic force microscope is a powerful tool to investigate the surface topography with atomic resolution. Here we propose a new approach to estimate the interaction between its tips and samples, which combines a semi-empirical model with density functional theory (DFT) calculations. The generated frequency shift images are consistent with the experiment for mapping organic molecules using CuCO, Cu, CuCl, and CuO x tips. This approach achieves accuracy close to DFT calculation with much lower computational cost.
Databáze: OpenAIRE