| Autor: |
Sung Kim, Jeffrey R. Guerrieri, David R. Novotny, Joshua A. Gordon |
| Rok vydání: |
2016 |
| Předmět: |
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| Zdroj: |
2016 Progress in Electromagnetic Research Symposium (PIERS). |
| DOI: |
10.1109/piers.2016.7735566 |
| Popis: |
In last several decades, the free-space measurement methods have been popularly employed to characterize dielectric materials at microwave frequencies. The conventional methods based on transmission and/or reflection scattering parameter measurements for test materials with vector network analyzers (VNAs) derive complex permittivity in broadband frequency ranges assuming that dimensions of samples are precisely known prior to measurements. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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