Direct measurement of the linear energy transfer of ions in silicon for space application

Autor: Hong‐Wen Xiang, Hong Zou, Chen Hongfei, ZhanGuo Cui, JiQing Zou, Yu Xiangqian, WeiYing Zhong, ZhiHua Hao, SiPei Shao, Shi Weihong
Rok vydání: 2015
Předmět:
Zdroj: Science China Technological Sciences. 59:128-134
ISSN: 1869-1900
1674-7321
DOI: 10.1007/s11431-015-5773-8
Popis: The single event effect (SEE) is an important consideration in electronic devices used in space environments because it can lead to spacecraft anomalies and failures. The linear energy transfer (LET) of ions is commonly investigated in studies of SEE. The use of a thin detector is an economical way of directly measuring the LET in space. An LET telescope consists of a thin detector as the front detector (D1), along with a back detector that indicates whether D1 was penetrated. The particle radiation effect monitor (PREM) introduced in this paper is designed to categorize the LET into four bins of 0.2–0.4, 0.4–1.0, 1.0–2.0 and 2.0–20 MeV·cm2/mg, and one integral bin of LET>20 MeV·cm2/mg. After calibration with heavy ions and Geant4 analysis, the LET boundaries of the first four bins are determined to be 0.236, 0.479, 1.196, 2.254, and 17.551 MeV·cm2/mg, whereas that of the integral bin is determined to be LET>14.790 MeV·cm2/mg. The acceptances are calculated by Geant4 analysis as 0.452, 0.451, 0.476, 0.446, and 1.334, respectively. The LET accuracy is shown to depend on the thickness of D1; as D1 is made thinner, the accuracy of the measured values increases.
Databáze: OpenAIRE
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