Morphological, optical, and electrical characterizations and cryogenic reliability tests on AlInGaP red light emitting diodes immersed in liquid nitrogen
| Autor: | Hao-Zhu Zhang, Ming-Ling Lee, Po-Yuan Chen, Ming Yu Kuo, Cheng-Shan Chen, Hai-Wen Hsu, Ming-Jhe Wu, Hsiang Chen, Pei-Shu Hsieh, Chia-Feng Lin, Chun-Yen Yang |
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| Rok vydání: | 2021 |
| Předmět: |
Materials science
Ion beam Scanning electron microscope business.industry Negative resistance Liquid nitrogen Condensed Matter Physics Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials law.invention law Transmission electron microscopy Optoelectronics Electrical measurements Electrical and Electronic Engineering business Diode Light-emitting diode |
| Zdroj: | Journal of Materials Science: Materials in Electronics. 32:28287-28296 |
| ISSN: | 1573-482X 0957-4522 |
| DOI: | 10.1007/s10854-021-07205-6 |
| Popis: | Cryogenic tests on AlInGaP light emitting diodes (LEDs) were performed by placing LEDs in liquid nitrogen (LN2). To study the optical and electrical variations on the devices, optical and electrical measurements were conducted. Results indicate that red and blue shifts in spectra, negative resistance and drastic current drops in electrical characteristics were found during the LN2 cooling process. Moreover, focus ion beam was used to cut the devices and scanning electron microscopy and transmission electron microscope images were taken to study the changes. The analyses show that thermal expansion and cooling shrinkage may cause distortions on LED nanostructures and damage the device. The cooling LED reliability tests show promise on examination of LED devices for aeronautical and space technology applications. |
| Databáze: | OpenAIRE |
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