Leakage Control System Using Data Estimation of Resistive Memory

Autor:	Jun-Young Kweon, Tony Tae-Hyoung Kim, Yun-Heup Song, Jun-Tae Choi
Rok vydání:	2018
Předmět:	0301 basic medicine 03 medical and health sciences Resistive touchscreen 030104 developmental biology Computer science Control system Electronic engineering 02 engineering and technology 021001 nanoscience & nanotechnology 0210 nano-technology Resistive random-access memory Leakage (electronics)
Zdroj:	ISOCC
DOI:	10.1109/isocc.2018.8649917
Popis:	In this work, we present a data-aware read sneak current control technique for improving sensing margins in cross-point (X-point) resistive memories. We introduce a novel method of estimating resistive memory data distribution. The result from this estimation is utilized for determining adequate bias condition for reliable read operation. The adjusted bias condition will realize constant leakage current, which facilitates reliable sensing regardless of the data distribution in the resistive memory array.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a44760d0d929a366c68eb6e805e0031e https://doi.org/10.1109/isocc.2018.8649917 Zobrazit plný text záznamu