JCPDS — International Centre for Diffraction Data Sample Preparation Methods in X-Ray Powder Diffraction
| Autor: | Marlene C. Morris, J. W. Visser, Deane K. Smith, R. Jenkins, L. K. Frevel, T. G. Fawcett |
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| Rok vydání: | 1986 |
| Předmět: |
Diffraction
Reproducibility Accuracy and precision Radiation Materials science business.industry Condensed Matter Physics Sample (graphics) Crystallography Optics International Centre for Diffraction Data General Materials Science Sample preparation Crystallite business Instrumentation Powder diffraction |
| Zdroj: | Powder Diffraction. 1:51-63 |
| ISSN: | 1945-7413 0885-7156 |
| DOI: | 10.1017/s0885715600011581 |
| Popis: | The aim of any diffraction experiment is to obtain reproducible data of high accuracy and precision so that the data can be correctly interpreted and analyzed. Various methods of sample preparation have been devised so that reproducibility, precision and accuracy can be obtained. The success of a diffraction experiment will often depend on the correct choice of preparation method for the sample being analyzed and for the instrument being used in the analysis.A diffraction pattern contains three types of useful information: the positions of the diffraction maxima, the peak intensities, and the intensity distribution as a function of diffraction angle. This information can be used to identify and quantify the contents of the sample, as well as to calculate the material's crystallite size and distribution, crystallinity, and stress and strain. The ideal preparation for a given experiment depends largely on information desired. |
| Databáze: | OpenAIRE |
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